BENEFITS OF HAVING AN SEM-EDS SYSTEM

  • To examine a particular feature or a microstructure of interest as reveled during optical microscopy, as well as to analyze composition of the feature of interest on a micro-scale, scanning electron microscopy and associated energy-dispersive X-ray spectroscopic microanalysis (SEM-EDS) is employed.

  • Sample examined during optical microscopy (from as-received to polished solid section or thin section or small sample extracted or a powder mount) is then subsequently coated with a thin conductive gold or carbon film for detailed SEM-EDS studies 

  • Procedures for SEM examinations are described in ASTM C 1723.

 

BACKSCATTER ELECTRON IMAGING

 

ELEMENTAL MAPPING

 

FAILURE INVESTIGATION OF CONCRETE

 

FAILURE INVESTIGATION OF CONCRETE

 

FAILURE INVESTIGATION OF CONCRETE

 

POTENTIALLY UNSOUND CONSTITUENTS IN CONCRETE AGGREGATES

 

ANALYSIS OF HISTORIC MORTARS

 

CHARACTERIZATION OF MASONRY BINDERS

 

CHARACTERIZATION OF MASONRY BINDERS

 

IDENTIFYING RAW FEEDS AND MANUFACTURING PROCESS USED IN DEVELOPMENT OF HISTORIC BINDERS

 

MATERIALS CHARACTERIZATION

 

CHARACTERIZATION OF SHRINKAGE-COMPENSATING GROUTS

 

SCANNING ELECTRON MICROSCOPY, X-RAY MICROANALYSIS OF CONCRETES

 
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