Serving the Industry through Testing, Investigation, Evaluation, & Research
CMC has a Cambridge 'CamScan' Scanning Electron Microscope (currently supported by Tescan USA), which is equipped with a secondary electron detector, a backscatter electron detector, and an EDS detector for X-ray microanalysis. The attached 4Pi software provide fully automated oxide and/or elemental analysis of multiple points in a sample.
The SEM-EDS unit has been at the forefront of various projects involving failure investigation of construction materials.
Follow here to find out about this scanning electron microscopy laboratory.
Construction Materials Consultants, Inc.
Berkshire Center, Suite 104
4727 Route 30
Greensburg, PA 15601
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